In a huge software project for an embedded application, a function behaved in a strange fashion. A variable, which must not be changed while the function is executed, was changed. The function itself ...

Scan is a structured test approach in which the overall function of an integrated circuit (IC) is broken into smaller structures and tested individually. Every state element (D flip-flop or latch) is ...

Adding assertions early and throughout the ASIC design cycle is the best way to independently check that design code reflects the intended behavior as specified in design specifications and the ...