Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage their performance. The imaging method, which was ...

Researchers have shown that expensive aberration-corrected microscopes are no longer required to achieve record-breaking microscopic resolution. Researchers at the University of Illinois at ...

A comparison of experimental annular dark field (ADF)-scanning transmission electron microscopy (STEM) and electron ptychography in uncorrected and aberration-corrected electron microscopes. In the ...