A methodology to create efficient manufacturing mixed-signal tests that reduce both test costs and test escapes.

To ensure customers receive high-quality products, engineers must consider testing strategies before they even think about a schematic diagram. These days, most engineers realize boundary scan ...

Companies specializing in circuit board and system design-for-test (DFT) tools are pursuing a variety of strategies to serve test and debug applications based on innovations they announced over the ...

For decades, process and design scaling has triggered the adoption of transformative test solutions. About twenty years ago, when at-speed test became a de-facto requirement, on-chip compression ...

As IC geometries shrink, the large, consolidated memory blocks within ICs are giving way to tens or even hundreds of smaller memory arrays distributed throughout each chip. These arrays serve as ...

Boundary Scan: What Is It? Boundary scan test techniques were first discussed in the late 1980s. At the time, experts believed that the growing complexity of chips would have a serious effect on an ...