Traditional IC pattern-generation methods focus on detectingdefects at gate terminals or at interconnects. Unfortunately, a significantpopulation of defects may occur within an IC's gates, or cells.

This week, a paper by social science researchers Noble Kuriakose and Michael Robbins was presented at a conference in Bethesda, Maryland. In it, they assert that as much as one-fifth of polling ...

Data quality testing platform Soda Data NV today announced the launch of SodaGPT, a data management platform that uses generative artificial intelligence to help users define data quality expectations ...

Today's methods for BER (bit-error-rate) testing of high-speed serial links such as PCIe and SATA rely on predetermined patterns that don't represent real-world situations. These patterns use a ...

When it comes to semiconductor device testing, the primary goal is to ensure that each device meets functional and performance specifications. Testing also plays a crucial role in confirming that ...

While the datasets are useful tools for training AI models, they do come with their own risks, from regulatory risks to ...